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Inspection

High-precision drive systems for your inspection applications. For reliable inspection results and optimal results from your inspection system – we supply absolutely precise and repeatable motion and positioning systems for moving and positioning detectors, X-ray sources and inspection cameras.

Testy EOL dosiek s plošnými spojmi

Vysokorýchlostná vertikálna os pre presné elektrické testy dosiek plošných spojov na konci výrobnej linky.
Mini vreteno v meracej technike

Presné polohovanie senzora pomocou miniatúrneho guľôčkového prevodu v meracom systéme.
Precision cross table for wafer inspection

A precision cross table enables simultaneous inspection of silicon wafers from above and below.
Precision cross table with cleanroom energy chain

Precision cross table with innovative cleanroom-compatible energy supply system for inspecting wafers.